Photonics West 2011 Moscone Center, San Francisco, CA January 25, 26, 27
January 2011: IFA-100 Optical Fiber Analyzer will be demonstrated at our booth, 5104, located in the North Hall!
Photonics West 2011 Moscone Center San Francisco, CA Thursday, January 27 1:50PM-2:20PM
January, 2011: Measuring the spatial distribution of rare-earth dopants in high-power optical fibers an invited presentation delivered by Andrew D. Yablon
March, 2010: Interfiber Analysis introduces the IFA-100 Multiwavelength Optical Fiber Analyzer based on its exclusive patent-pending technology. This revolutionary fiber index profiling equipment was demonstrated at the Interfiber Analysis booth during the OFC 2010 exhibit in San Diego, CA.
For the first time, an optical fiber index profiler that requires no
cleave and quickly and accurately measures fiber index profiles at any
wavelength from 450 nm to 1 micron!
Click on link at left to view the instrument datasheet.
February 2010: The IEEE Journal of Lightwave Technology publishes the peer-reviewed article "Multi-Wavelength Optical Fiber Refractive Index Profiling" in Volume 28, Issue number 2, February 2010.
January 2010: Interfiber Analysis presents "Multiwavelength Optical Fiber Refractive Index Profiling," SPIE paper 7580-40 at SPIE Photonics West
Conference held in San Francisco, CA.
October 2009: Interfiber Analysis announces that Dr. Andrew D. Yablon will give a short course entitled
"Interconnection and Splicing of High-Power Optical Fibers" at 8:30 AM on Wednesday, January 27, 2010 at the upcoming SPIE Photonics West Conference to be held in San Francisco, CA.
March 2009: Interfiber Analysis presented a Postdeadline Paper on "Multi-Wavelength Optical Fiber Refractive Index Profiling by Spatially Resolved Fourier Transform Spectroscopy" at OFC/NFOEC 2009 in San Diego, CA on March 26, 2009.